Talks and Poster Presentations (with Proceedings-Entry):
P.H. Osanna, M.N. Durakbasa, A. Afjehi-Sadat, J.M. Bauer:
"Artificial Intelligence and Information Technology to Support Measurement Technique in Modern Production Plants";
Talk: First International IEEE Symposium,
Varna;
09-10-2002
- 09-12-2002; in: "Intelligent Systems",
IEEE,
Volume 1
(2002),
ISBN: 0-7803-7134-8;
17
- 23.
English abstract:
To meet market demands in present and future global industrial world, manufacturing enterprises must be flexible and agile enough to quickly respond to product demand changes. With support of artificial intelligence and modern information technology it is possible to realize modern cost-effective customer-driven design and manufacturing taking into account the importance and basic role of quality management and metrology. This will be especially possible on the basis of an innovative concept and model for modern enterprises the so-called Multi-Functions Integrated Factory (MFIF) that makes possible an agile and optimal industrial production.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IS.2002.1044222
Electronic version of the publication:
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1044222
Created from the Publication Database of the Vienna University of Technology.