Talks and Poster Presentations (with Proceedings-Entry):
M.N. Durakbasa, G. Bas, D. Riepl, J.M. Bauer:
"An Innovative Educational Concept of Teleworking in the High Precision Metrology Laboratory to Develop a Model of Implementation in the Advanced Manufacturing Industry";
Talk: 2015 12th International Conference on Remote Engineering and Virtual Instrumentation (REV),
Bangkok, Thailand;
02-25-2015
- 02-28-2015; in: "IEEE Conference Publications",
IEEE,
(2015),
ISBN: 978-1-4799-7838-0;
Paper ID DOI: 10.1109/REV.2015.7087288,
7 pages.
English abstract:
The production of very precise components goes hand in hand with the development of the necessary metrology, and a wide range of measuring instruments has been devised to cater for the evaluation of surfaces and structures down to the nanometric scale. The advancement in the industry requires this special infrastructure, equipment and expertise that are of high cost if integrated into the organization.
Keywords:
advanced integrated management system, intelligent metrology, micro and nanotechnology, remote control, smart
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/REV.2015.7087288
Created from the Publication Database of the Vienna University of Technology.