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Talks and Poster Presentations (with Proceedings-Entry):

F. Lasagni, H.P. Degischer:
"FIB EDX Tomography - 3D Characterization of Al-Si eutectics";
Poster: Junior Scientist Conference 2006, TU Wien; 04-19-2006 - 04-21-2006; in: "Junior Scientist Conference 2006, Proceedings", (2006), ISBN: 3-902463-05-8; 149 - 150.



English abstract:
A detailed study of the 3D morphology of different eutectic architectures of unmodified and Sr-modified AlSi7-12 alloys is represented by means of a new Focused Ion Beam - Energy Dispersive Spectroscopy (FIB-EDX) method. These 3D structures can be reconstructed from sequential 2D sectioning and subsequent computer imaging. Both aluminum and silicon phases are identified with a voxel resolution of ~60 x 75nm2 in the image plane and ~60-300nm between each slice. EDX imaging is applied in case of very low contrast between the constituent phases by Scanning Electron Microscopy (SEM) in Secondary Electron (SE) or Back Scattering Electron (BSE) modes. The eutectic structure and the interconnectivity between lamellar Si are investigated, as well as the morphological changes induced by the addition of Sr.


Online library catalogue of the TU Vienna:
http://aleph.ub.tuwien.ac.at/F?base=tuw01&func=find-c&ccl_term=AC06587335


Created from the Publication Database of the Vienna University of Technology.